- Test Tool Qualification through Fault Injection
Q. Wang, A. Wallin, Viacheslav Izosimov, Urban Ingelsson, Zebo Peng
IEEE 17th European Test Symposimu (ETS 2012), Annecy, France, May 28-June 1, 2012.
- An MPSoCs Demonstrator for Fault Injection and Fault Handling in an IEEE P1687 Environment
Kim Petersen, Dimitar Nikolov, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
IEEE 17th European Test Symposimu (ETS 2012), Annecy, France, May 28-June 1, 2012.
- Level of Confidence Evaluation and Its Usage for Roll-back Recovery with Checkpointing Optimization
Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson
5th Workshop on Dependable and Secure Nanocomputing (WSDN 2011), Hong Kong, June 27, 2011.
- Study on the Level of Confidence for Roll-back Recovery with Checkpointing
Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson
1st Intl. Workshop on Dependability Issues in Deep-submicron Technologies (DDT 2011), Trondheim, Norway, May 26-27, 2011.
- A Study of Instrument Reuse and Retargeting in P1687
Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson
IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011), MNIT Jaipur, India, November 25-26, 2011.
- Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias
Breeta SenGupta, Urban Ingelsson, Erik Larsson
25th International Conference on VLSI Design (VLSI 2012), Hyderabad, India, January 7-11, 2012.
- Test Planning for Core-based 3D Stacked ICs under Power Constraints
Breeta SenGupta, Urban Ingelsson, Erik Larsson
3rd IEEE Intl. Workshop on Reliability Aware System Design and Test (RASDAT 2012), Hyderabad, India, January 7-8, 2012.
- Test Planning for 3D Stacked ICs with Through-Silicon Vias
Breeta SenGupta, Urban Ingelsson, Erik Larsson
2nd IEEE Intl. Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST), Anaheim, CA, USA, September 22-23, 2011.
- Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson
IEEE Design & Test of Computers, Apr. 2012, Volume 29, Issue 2, pp. 79-88.
- Access Time Analysis for IEEE P1687
Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
IEEE Transactions on Computers, Oct. 2012, Volume 61, Issue 10, pp 1459-1472.
- Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson
20th IEEE Asian Test Symposium (ATS 2011), New Delhi, India, November 21-23, 2011.
- Test Scheduling with Constraints for IEEE P1687 (poster)
Golnaz Asani, Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
International Test Conference (ITC 2011), Anaheim, CA, USA, September 18-23, 2011.
- Scheduling Tests for 3D Stacked Chips under Power Constraints
Breeta SenGupta, Urban Ingelsson, Erik Larsson
Journal of Electronic Testing: Theory and Applications (JETTA), Feb. 2012, Volume 28, Issue 1, pp. 121-135.
- Test Scheduling and Test Access Optimization for Core-Based 3D Stacked ICs with Through-Silicon Vias (poster)
Breeta SenGupta, Urban Ingelsson, Erik Larsson
European Test Symposium (ETS 2011), Trondheim, Norway, May 23-27, 2011.
- Automated Design for IEEE P1687
Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
- Test Cost Modeling for 3D Stacked Chips with Through-Silicon Vias
Breeta SenGupta, Urban Ingelsson, Erik Larsson
The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
- Level of Confidence Study for Roll-back Recovery with Checkpointing
Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson
The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
- Cost Reduction of Wear-Out Monitoring by Measurement Point Selection
Urban Ingelsson, Shih-Yen Chang, Erik Larsson
The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
- Measurement Point Selection for In-Operation Wear-Out Monitoring
Urban Ingelsson, Shih-Yen Chang, Erik Larsson
14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS11), Cottbus, Germany, April 13-15, 2011.
- Test Scheduling for 3D Stacked ICs under Power Constraints
Breeta SenGupta, Urban Ingelsson, Erik Larsson
2nd IEEE International Workshop on Reliability Aware System Design and Test (RASDAT), Chennai, India, January 6-7, 2011.
- Test scheduling on IJTAG
Erik Larsson, Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson
Nordic Test Forum (NTF 2010), Drammen, Norway, November 23-24, 2010.
- Design Automation for IEEE P1687
Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
Design, Automation and Test in Europe (DATE 2011), Grenoble, France, March 14-18, 2011.
- Power Constrained Test Scheduling for 3D Stacked Chips (poster)
Breeta SenGupta, Urban Ingelsson, Erik Larsson
1st IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, Austin, TX, USA, November 4-5, 2010.
- Scheduling Tests for 3D Stacked Chips Under Power Constraints
Breeta SenGupta, Urban Ingelsson, Erik Larsson
6th International Symposium on Electronic Design, Test and Applications (DELTA 2011), Queenstown, New Zealand, January 17-19, 2011.
- Optimizing Fault Tolerance for Multi-Processor System-on-Chip
Dimitar Nikolov, Mikael Väyrynen, Urban Ingelsson, Erik Larsson, Virendra Singh
Book Chapter in "Design and Test Technology for Dependable Systems-on-chip", Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ISBN: 978-1-6096-0212-3, 2010.
- Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs
Anders Larsson, Urban Ingelsson, Erik Larsson, Krishnendu Chakrabarty
Book Chapter in "Design and Test Technology for Dependable Systems-on-chip", Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ISBN: 978-1-6096-0212-3, 2010.
- Efficient Embedding of Deterministic Test Data
Mudassar Majeed, Daniel Ahlström, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.
- Test Time Analysis for IEEE P1687
Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.
- Vdd-Aware Model for the Voltage on Bridged Nodes
Urban Ingelsson
Workshop track of the IEEE European Test Symposium (ETS 2010), Prague, Czech Republic, May 24-28, 2010
- Efficient Embedding of Deterministic Test Data
Mudassar Majeed, Daniel Ahlström, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
Swedish SoC Conference 2010, Kolmården, Sweden, May 3-4, 2010 (not reviewed, not printed)
- Scheduling Tests for Stacked 3D Chips under Power Constraints
Breeta SenGupta, Urban Ingelsson, Erik Larsson
Swedish SoC Conference 2010, Kolmården, Sweden, May 3-4, 2010 (not reviewed, not printed)
- Mapping and Scheduling of Jobs in Homogeneous NoC-based MPSoC
Dimitar Nikolov, Erik Karlsson, Urban Ingelsson, Virendra Singh, Erik Larsson
Swedish SoC Conference 2010, Kolmården, Sweden, May 3-4, 2010 (not reviewed, not printed)
- Vdd-Aware Bridge Defect Model
Urban Ingelsson
Swedish SoC Conference 2010, Kolmården, Sweden, May 3-4, 2010 (not reviewed, not printed)
- Equation-Based Vdd-Aware Model for Resistive Bridge Behavior
Urban Ingelsson
IEEE International Workshop on Realiability Aware System Design and Test (RASDAT 2010), Bangalore, India, January 7-8, 2010, pp. 34-39.
- On-line Techniques to Adjust and Optimize Checkpointing Frequency
Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson
IEEE International Workshop on Realiability Aware System Design and Test (RASDAT 2010), Bangalore, India, January 7-8, 2010, pp. 29-33.
- Estimating Error-Probability and Its Application for Optimizing Roll-back Recovery with Checkpointing
Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson
5th IEEE Intl. Symposium on Electronic Design, Test & Applications (DELTA 2010), Ho Chi Minh City, Vietnam, January 13-15, 2010, pp. 281-285.
- Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
Urban Ingelsson, Sandeep-Kumar Goel, Erik Larsson, Erik-Jan Marinissen
IEEE European Test Symposium (ETS'05), Tallinn, Estonia, May 22-25, 2005, pp. 8-13
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