Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs
Book Chapter in "Design and Test Technology for Dependable Systems-on-chip", Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ISBN: 978-1-6096-0212-3, 2010.
http://www.amazon.com/Design-Technology-Dependable-Systems-chip/dp/1609602129
ABSTRACT
[LILC10] Anders Larsson, Urban Ingelsson, Erik Larsson, Krishnendu Chakrabarty, "Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs", Book Chapter in "Design and Test Technology for Dependable Systems-on-chip", Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ISBN: 978-1-6096-0212-3, 2010. |
|
