- Software-based Self-Testing using Bounded Model Checking for Out-of-Order Superscalar Processors
Ying Zhang, Krishnendu Chakrabarty, Zebo Peng, Ahmed Rezine, Huawei Li, Petru Eles, Jianhui Jiang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Software-based Self-Testing using Bounded Model Checking for Out-of-Order Superscalar Processors
Ying Zhang, Krishnendu Chakrabarty, Zebo Peng, Ahmed Rezine, Huawei Li, Petru Eles, Jianhui Jiang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Manufacturing Test Solutions for System-On-Chip Integrated Circuits (One-day Tutorial)
Erik Larsson, Krishnendu Chakrabarty
VLSI Design and Test Symposium (VDAT 2007), Kolkata, India, August 2007.
- Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs
Anders Larsson, Urban Ingelsson, Erik Larsson, Krishnendu Chakrabarty
Book Chapter in "Design and Test Technology for Dependable Systems-on-chip", Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ISBN: 978-1-6096-0212-3, 2010.
- SOC Test Optimization with Compression-Technique Selection
Anders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty
A Workshop in Conjunction with the International Test Conference, Santa Clara, CA, USA, October 28-30, 2008 (Informal Digest).
- Core-Level Expansion of Compressed Test Patterns
Anders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty
17th Asian Test Symposium (ATS), Sapporo, JAPAN, November 24-27, 2008, pp. 277-282.
- Cycle-Accurate Test Power Modeling and its Application to SoC Test Architecture Design and Scheduling
Soheil Samii, Mikko Selkälä, Erik Larsson, Krishnendu Chakrabarty, Zebo Peng
IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, Vol. 27, Issue 5, May 2008, pp. 973-977.
- Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns
Anders Larsson, Erik Larsson, Krishnendu Chakrabarty, Petru Eles, Zebo Peng
Design, Automation, and Test in Europe (DATE 2008), Munich, Germany, March 10-14, 2008, 188- 193.
- Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling
Soheil Samii, Erik Larsson, Krishnendu Chakrabarty, Zebo Peng
International Test Conference (ITC'06), Santa Clara, California, USA, October 24-26, 2006, pp. 32.1 (1-10)
|
|
