Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
IEEE European Test Symposium (ETS'05), Tallinn, Estonia, May 22-25, 2005, pp. 8-13
ABSTRACT
Complex SOCs are increasingly tested in a modular fashion, which enables us to record the yield-per-module. In this paper, we consider the yield-per-module as the pass probability of the module's manufacturing test. We use it to exploit the abort-on-fail feature of ATEs, in order to reduce the expected test application time. We present a model for expected test application time, which obtains increasing accuracy due to decreasing granularity of the abortable test unit. For a given SOC, with a modular test architecture consisting of wrappers and disjunct TAMs, and for given pass probabilities per module test, we schedule the tests on each TAM such that the expected test application time is minimized. We describe two heuristic scheduling approaches, one without and one with preemption. Experimental results for the ITC'02 SOC Test Benchmarks demonstrate the effectiveness of our approach, as we achieve up to 97% reduction in the expected test application time, without any modification to the SOC or ATE.
Copyright note for papers published by the IEEE Computer Society:
Copyright IEEE. Personal use of this material is permitted. However,
permission to reprint/republish this material for advertising or
promotional purposes or for creating new collective works for resale
or redistribution to servers or lists, or to reuse any copyrighted
component of this work in other works, must be obtained from the IEEE.
[IGLM05] Urban Ingelsson, Sandeep-Kumar Goel, Erik Larsson, Erik-Jan Marinissen, "Test Scheduling for Modular SOCs in an Abort-on-Fail Environment", IEEE European Test Symposium (ETS'05), Tallinn, Estonia, May 22-25, 2005, pp. 8-13 |
