- Improved Scan Chain Diagnosis
Erik-Jan Marinissen, Dan Adolfsson, Erik Larsson, Sandeep-Kumar Goel
15th NXP IC Test Symposium (NITS'07), Eindhoven, The Netherlands, June 11, 2007 (Informal Digest)
- Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
Urban Ingelsson, Sandeep-Kumar Goel, Erik Larsson, Erik-Jan Marinissen
IEEE European Test Symposium (ETS'05), Tallinn, Estonia, May 22-25, 2005, pp. 8-13
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