erima_nits07

Improved Scan Chain Diagnosis Erik-Jan Marinissen Dan Adolfsson Erik Larsson Sandeep-Kumar Goel 15th NXP IC Test Symposium (NITS'07), Eindhoven, The Netherlands, June 11, 2007 (Informal Digest) ABSTRACT [MALG07] Erik-Jan Marinissen, Dan Adolfsson, Erik Larsson, Sandeep-Kumar Goel, "Improved Scan Chain Diagnosis", 15th NXP IC Test Symposium (NITS'07), Eindhoven, The Netherlands, June 11, 2007 (Informal Digest)

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