- Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
Tobias Dubois, Erik-Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters
Design, Automation, and Test in Europe (DATE), Nice, France, April 16-20, 2007, pp. 859-864.
- Improved Scan Chain Diagnosis
Erik-Jan Marinissen, Dan Adolfsson, Erik Larsson, Sandeep-Kumar Goel
15th NXP IC Test Symposium (NITS'07), Eindhoven, The Netherlands, June 11, 2007 (Informal Digest)
- High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
Tobias Dubois, Mohamed Azimane, Erik Larsson, Erik-Jan Marinissen, Paul Wielage, Clemens Wouters
14th Philips Research IC Test Seminar (PRITS), Eindhoven, The Netherlands, June 27, 2006
- Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
Urban Ingelsson, Sandeep-Kumar Goel, Erik Larsson, Erik-Jan Marinissen
IEEE European Test Symposium (ETS'05), Tallinn, Estonia, May 22-25, 2005, pp. 8-13
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