High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
14th Philips Research IC Test Seminar (PRITS), Eindhoven, The Netherlands, June 27, 2006
ABSTRACT
[DALM06] Tobias Dubois, Mohamed Azimane, Erik Larsson, Erik-Jan Marinissen, Paul Wielage, Clemens Wouters, "High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO", 14th Philips Research IC Test Seminar (PRITS), Eindhoven, The Netherlands, June 27, 2006 |
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