Testing of Digital Systems
Lectures:
20 h
Recommended for
Recommended for: IDA Ph.D. students in computer science and computer systems. ECSEL students.
The course was last given:
New course.
Goals
To study the basic principles and practice of test technology and design-for-test methods for digital systems. To address also issues related to the integration of test consideration with system synthesis and to system-on-chip testing.
Prerequisites
Basic knowledge of computer organization and digital hardware.
Organization
Mainly lectures given by the teachers, which will be supplemented by seminars prepared by the participants.
Contents
- Introduction.
- Fault modeling and simulation.
- Automatic test pattern generation.
- Basic principles of design for testability.
- Testability analysis.
- Testability enhancement techniques.
- Test synthesis.
- Testability issues in hardware/software systems.
- Test issues related to system-on-chip.
- On-line testing and self-checking design.
- Built-in self-test and special BIST architectures.
Literature
M. Abramovici, M. A. Breuer, and A. D. Friedman, "Digital Systems Testing and Testable Design," Computer Science Press, 1990, ISBN 0-7803-1062-4
Lecture notes
Selected papers
Teachers
Zebo Peng and Petru Eles.
Examiner
Zebo Peng .
Schedule
Oct-Dec 2000.
Examination
Term paper and seminar presentation.
Credit
4 credits
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