Testing of Digital Systems

Lectures:
20 h

Recommended for
Recommended for: IDA Ph.D. students in computer science and computer systems. ECSEL students.

The course was last given:
New course.

Goals
To study the basic principles and practice of test technology and design-for-test methods for digital systems. To address also issues related to the integration of test consideration with system synthesis and to system-on-chip testing.

Prerequisites
Basic knowledge of computer organization and digital hardware.

Organization
Mainly lectures given by the teachers, which will be supplemented by seminars prepared by the participants.

Contents

• Introduction.
• Fault modeling and simulation.
• Automatic test pattern generation.
• Basic principles of design for testability.
• Testability analysis.
• Testability enhancement techniques.
• Test synthesis.
• Testability issues in hardware/software systems.
• Test issues related to system-on-chip.
• On-line testing and self-checking design.
• Built-in self-test and special BIST architectures.

Literature
M. Abramovici, M. A. Breuer, and A. D. Friedman, "Digital Systems Testing and Testable Design," Computer Science Press, 1990, ISBN 0-7803-1062-4
Lecture notes
Selected papers

Teachers
Zebo Peng and Petru Eles.

Examiner
Zebo Peng .

Schedule
Oct-Dec 2000.

Examination
Term paper and seminar presentation.

Credit
4 credits

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