- BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature
Y. Zhang, Y. Ding, Z. Peng, H. Li, M. Fujita, and J. Jiang
IEEE Trans. on Very Large Scale Integration (VLSI) Systems
- Software-based Self-Testing using Bounded Model Checking for Out-of-Order Superscalar Processors
Ying Zhang, Krishnendu Chakrabarty, Zebo Peng, Ahmed Rezine, Huawei Li, Petru Eles, Jianhui Jiang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- A Deterministic-Path Routing Algorithm for Tolerating Many Faults on Wafer-Level NoC
Zhongsheng Chen, Ying Zhang, Zebo Peng, Jianhui Jiang
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), Florence, Italy
- Software-based Self-Testing using Bounded Model Checking for Out-of-Order Superscalar Processors
Ying Zhang, Krishnendu Chakrabarty, Zebo Peng, Ahmed Rezine, Huawei Li, Petru Eles, Jianhui Jiang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Temperature-Aware Software-Based Self-Testing for Delay Faults
Ying Zhang, Zebo Peng, J. Jiang, H. Li, M. Fujita
Proc. Design, Automation and Test in Europe Conference (DATE’15), Grenoble, France, Mar. 9-13, 2015.
- Energy Aware Real-Time Scheduling Policy with Guaranteed Security Protection
Wei Jiang, Ke Jiang, Xia Zhang, Yue Ma
19th Asia and South Pacific Design Automation Conference (ASPDAC 2014), SunTec, Singapore, January 20-23, 2014
- Design Optimization of Security-Sensitive Mixed-Criticality Real-Time Embedded Systems
Xia Zhang, Jinyu Zhan, Wei Jiang, Yue Ma and Ke Jiang
1st workshop on Real-Time Mixed Criticality Systems (ReTiMiCS2013), Taipei, Taiwan, August 21, 2013.
- Design Optimization of Energy- and Security-Critical Distributed Real-Time Embedded Systems
Xia Zhang, Jinyu Zhan, Wei Jiang, Yue Ma, Ke Jiang
15th Workshop on Advances in Parallel and Distributed Computational Models (APDCM 2013), Boston, USA, May 20, 2013.
- Automatic Test Program Generation for Out-of-Order Superscalar Processors
Ying Zhang, Ahmed Rezine, Petru Eles, Zebo Peng
21st IEEE Asian Test Symposium (ATS 2012), Niigata, Japan, November 19-22, 2012.
- Automatic Test Program Generation Using Executing Trace Based Constraint Extraction for Embedded Processors
Ying Zhang, Huawei Li, Xiaowei Li
IEEE Transactions on Very Large Scale Integration Systems, 2012.
- Immune Genetic Algorithms for Optimization of Task Priorities and FlexRay Frame Identifiers
Soheil Samii, Yanfei Yin, Zebo Peng, Petru Eles, Yuanping Zhang
Intl. Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA), Beijing, China, August 24-26, 2009, pp. 486-493.
- SOC Test Optimization with Compression-Technique Selection
Anders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty
A Workshop in Conjunction with the International Test Conference, Santa Clara, CA, USA, October 28-30, 2008 (Informal Digest).
- Core-Level Expansion of Compressed Test Patterns
Anders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty
17th Asian Test Symposium (ATS), Sapporo, JAPAN, November 24-27, 2008, pp. 277-282.
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