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BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature

Y. Zhang

Y. Ding

Z. Peng

H. Li

M. Fujita

and J. Jiang

IEEE Trans. on Very Large Scale Integration (VLSI) Systems

ABSTRACT

[ZDPL22] Y. Zhang, Y. Ding, Z. Peng, H. Li, M. Fujita, and J. Jiang, "BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature", IEEE Trans. on Very Large Scale Integration (VLSI) Systems

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