- BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature
Y. Zhang, Y. Ding, Z. Peng, H. Li, M. Fujita, and J. Jiang
IEEE Trans. on Very Large Scale Integration (VLSI) Systems
- Temperature-Aware Software-Based Self-Testing for Delay Faults
Ying Zhang, Zebo Peng, J. Jiang, H. Li, M. Fujita
Proc. Design, Automation and Test in Europe Conference (DATE’15), Grenoble, France, Mar. 9-13, 2015.
|
|
