yinzh_VLSI12

Automatic Test Program Generation Using Executing Trace Based Constraint Extraction for Embedded Processors

Ying Zhang
 
Huawei Li
Xiaowei Li

IEEE Transactions on Very Large Scale Integration Systems, 2012.

ABSTRACT


[ZLL12] Ying Zhang, Huawei Li, Xiaowei Li, "Automatic Test Program Generation Using Executing Trace Based Constraint Extraction for Embedded Processors", IEEE Transactions on Very Large Scale Integration Systems, 2012.
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