Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC
10th IEEE Workshop on RTL and High Level Testing (WRTLT'09), Hongkong, China, November 27-28, 2009, pp. 43-48.
ABSTRACT
[TLSF09] Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara, "Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC", 10th IEEE Workshop on RTL and High Level Testing (WRTLT'09), Hongkong, China, November 27-28, 2009, pp. 43-48. |
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