- Scan Cells Reordering to Minimize Peak Power During Test Cycle: A Graph Theoretic Approach
Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara
IEEE European Test Symposium (ETS'10), Prague, Czech Republic, May 24-28, 2010.
- Graph Theoretic Approach for Scan Cell Reordering to Minimize Peak Shift Power
Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara
Great Lakes Symposium on VLSI (GLSVLSI'10), Rhode Island, USA, May 16-18, 2010, pp. 73-78.
- Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC
Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara
10th IEEE Workshop on RTL and High Level Testing (WRTLT'09), Hongkong, China, November 27-28, 2009, pp. 43-48.
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