jaytu_ets10

Scan Cells Reordering to Minimize Peak Power During Test Cycle: A Graph Theoretic Approach

Jaynarayan T. Tudu

Erik Larsson

Virendra Singh

Hideo Fujiwara

IEEE European Test Symposium (ETS'10), Prague, Czech Republic, May 24-28, 2010.

ABSTRACT

[TLSF10] Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara, "Scan Cells Reordering to Minimize Peak Power During Test Cycle: A Graph Theoretic Approach", IEEE European Test Symposium (ETS'10), Prague, Czech Republic, May 24-28, 2010.

( ! ) perl script by Giovanni Squillero with modifications from Gert Jervan (v3.1, p5.2, September-2002-)