Hierarchical Test Generation for Digital Systems
Mixed Design of Integrated Circuits and Systems, Kluwer Academic Publishers, pp. 131-136, 1998.
ABSTRACT
[BJMP98] Marina Brik, Gert Jervan, Antti Markus, Priidu Paomets, Jaan Raik, Raimund Ubar, "Hierarchical Test Generation for Digital Systems", Mixed Design of Integrated Circuits and Systems, Kluwer Academic Publishers, pp. 131-136, 1998. |
|
