- Hierarchical Test Generation for Digital Systems
Marina Brik, Gert Jervan, Antti Markus, Priidu Paomets, Jaan Raik, Raimund Ubar
Mixed Design of Integrated Circuits and Systems, Kluwer Academic Publishers, pp. 131-136, 1998.
- Hierarchical Test Generation with Multi-Level Decision Diagram Models
Gert Jervan, Antti Markus, Jaan Raik, Raimund Ubar
7th IEEE North Atlantic Test Workshop, West Greenwich, RI, USA, pp. 26-33, May 28-29, 1998.
- DECIDER: A Decision Diagram based Hierarchical Test Generation System
Gert Jervan, Antti Markus, Jaan Raik, Raimund Ubar
DDECS'98 Conference, pp. 269-273, Szczyrk, Poland, September 2-4, 1998.
|
|