Built-in Self-Test for ASICs and SoCs
Project Description
The objective is to develop methodology, algorithms and tools for doing testability analysis and testability enhancement in the early phases of the design process. The methodologies and tools are used to guide design space exploration for designing minimal area, self-testable digital designs. Both built in self-test register (BIST) cost and wiring overhead cost are taken into consideration during synthesis for self-testability optimization process.- Zebo Peng, contact person
- Petru Eles
- Abdil Rashid Mohamed
- A Wiring-Aware Approach to Minimizing Built-In Self-Test Overhead
Abdil Rashid Mohamed, Zebo Peng, Petru Eles
Journal of Computer Science and Technology, Vol.20, No.2, 2005, pp. 216-223 - High-Level Techniques for Built-In Self-Test Resources Optimization
Abdil Rashid Mohamed
Licentiate Thesis No. 1156, Dept. of Computer and Information Science, Linköping University, April 2005 - A Heuristic for Wiring-Aware Built-In Self-Test Synthesis
Abdil Rashid Mohamed, Zebo Peng, Petru Eles
EUROMICRO SYMPOSIUM ON DIGITAL SYSTEM DESIGN, Architectures, Methods and Tools, Rennes, France, August 31-September 3, 2004, pp. 408 - 415 - A Heuristic for Wiring-Aware Built-In Self-Test Synthesis
Abdil Rashid Mohamed, Petru Eles, Zebo Peng
Swedish System-on-Chip Conference 2004, Båstad, Sweden, April 13-14, 2004 (Informal Digest) - A Wiring-Aware Approach to Minimizing Built-In Self-Test Overhead
Abdil Rashid Mohamed, Zebo Peng, Petru Eles
The IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), Perth, Australia, January 28-30, 2004, pp. 413-415 - A Wiring-Aware Approach to Minimizing Built-In Self-Test Overhead
Abdil Rashid Mohamed, Zebo Peng, Petru Eles
4th Workshop on RTL and High Level Testing (WRTLT'03), Xian, China, November 20-21, 2003 - BIST Synthesis: An Approach to Resources Optimization under Test Time Constraints
Abdil Rashid Mohamed, Zebo Peng, Petru Eles
5th Design and Diagnostic of Electronic Computer Systems (DDECS2002), Brno, Czech Republic, April 16-19, 2002, pp. 346-351 - BIST Synthesis: An Approach to Resource Optimization under Test Time Constraints
Abdil Rashid Mohamed, Zebo Peng, Petru Eles
International Test Synthesis Workshop, Santa Barbara, USA, March 26-28, 2001
Project Members
Selected Publications