Test Time Minimization for Hybrid BIST with Test Pattern Broadcasting
The 21st NORCHIP Conference, Riga, Latvia, November 10-11, 2003, pp. 112-116
ABSTRACT
This paper describes a hybrid BIST architecture for testing core-based systems together with a method for test time minimization. The approach uses test pattern broadcasting for both pseudorandom and deterministic patterns. To overcome the high complexity of the test time minimization problem we propose a fast algorithm to find an efficient combination of pseudorandom and deterministic test sets under given memory constraints. The efficiency of the approach is demonstrated by experimental results.
[UJJP03] Raimund Ubar, Maksim Jenihhin, Gert Jervan, Zebo Peng, "Test Time Minimization for Hybrid BIST with Test Pattern Broadcasting", The 21st NORCHIP Conference, Riga, Latvia, November 10-11, 2003, pp. 112-116 |
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