On Minimization of Peak Power for Scan Circuit during Test
European Test Symposium (ETS 2009), Sevilla, Spain, May 25-29, 2009, pp. 25-30.
ABSTRACT
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current which results into supply voltage droop and eventually yield loss. This paper proposes an efficient methodology for test vector re-ordering to achieve minimum peak power supported by the given test vector set. The proposed methodology also minimizes average power under the minimum peak power constraint. A methodology to further reduce the peak power, below the minimum supported peak power, by inclusion of minimum additional vectors is also discussed. The paper defines the lower bound on peak power for a given test set. The results on several benchmarks shows that it can reduce peak power by up to 27%.
[TLSA09] Jaynarayan T Tudu, Erik Larsson, Virendra Singh, Vishwani Agrawal, "On Minimization of Peak Power for Scan Circuit during Test", European Test Symposium (ETS 2009), Sevilla, Spain, May 25-29, 2009, pp. 25-30. |
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