Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules
IEEE East-West Design & Test Symposium (EWDTS10), St. Petersburg, Russia, September 17-20, 2010.
ABSTRACT
[NRGL10] Vinay N.S., Indira Rawat, M.S. Gaur, Erik Larsson, Virendra Singh, "Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules", IEEE East-West Design & Test Symposium (EWDTS10), St. Petersburg, Russia, September 17-20, 2010. |
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