Power Constrained and Defect-Probability Driven SoC Test Scheduling with Test Set Partitioning
Swedish System-on-Chip Conference (SSoCC'06), Kolmården, Sweden, May 4-5, 2006 (Informal Digest)
ABSTRACT
[HPE06] Zhiyuan He, Zebo Peng, Petru Eles, "Power Constrained and Defect-Probability Driven SoC Test Scheduling with Test Set Partitioning", Swedish System-on-Chip Conference (SSoCC'06), Kolmården, Sweden, May 4-5, 2006 (Informal Digest) |
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