Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment
Swedish System-on-Chip Conference (SSoCC'05), Tammsvik, Stockholm, Sweden, April 18-19, 2005 (Informal Digest)
ABSTRACT
[HJPE05] Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles, "Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment", Swedish System-on-Chip Conference (SSoCC'05), Tammsvik, Stockholm, Sweden, April 18-19, 2005 (Informal Digest) |
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