Test Generation: A Hierarchical Approach
Chapter in System-level Test and Validation of Hardware/Software Systems, Springer Series in Advanced Microelectronics, Vol. 17, ISBN 1-85233-899-7, 2005
http://www.springeronline.com/sgw/cda/frontpage/0,11855,5-10041-22-34954084-0,00.html
ABSTRACT
[JUPE05] Gert Jervan, Raimund Ubar, Zebo Peng, Petru Eles, "Test Generation: A Hierarchical Approach", Chapter in System-level Test and Validation of Hardware/Software Systems, Springer Series in Advanced Microelectronics, Vol. 17, ISBN 1-85233-899-7, 2005 |
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