The Design and Optimization of SOC Test Solutions
ICCAD-2001, DoubleTree Hotel, San Jose, California, November 4-8, 2001, pp. 523-530
ABSTRACT
We propose an integrated technique for extensive optimization of the final test solution for System-on-Chip using Simulated Annealing. The produced results from the technique are a minimized test schedule fulfilling test conflicts under test power constraints and an optimized design of the test access mechanism. We have implemented the proposed algorithm and performed experiments with several benchmarks and industrial designs to show the usefulness and efficiency of our technique.
Related files: |
ICCAD01.pdf | Adobe Acrobat portable document |
[LPC01] Erik Larsson, Zebo Peng, Gunnar Carlsson, "The Design and Optimization of SOC Test Solutions", ICCAD-2001, DoubleTree Hotel, San Jose, California, November 4-8, 2001, pp. 523-530 |
|