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AUTHOR:KLAS ARVIDSSON
Found 2 entries
  1. Efficient Test Solutions for Core-based Designs
    Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng
    IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems, Vol.23, No.5, May 2004, pp. 758-775

  2. Integrated Test Scheduling, Test Parallelization and TAM Design
    Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng
    IEEE Asian Test Symposium (ATS'02), Tamuning, Guam, USA, November 18-20, 2002, pp. 397-404

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