Automatic Test Program Generation Using Executing Trace Based Constraint Extraction for Embedded Processors
IEEE Transactions on Very Large Scale Integration Systems, 2012.
ABSTRACT
[ZLL12] Ying Zhang, Huawei Li, Xiaowei Li, "Automatic Test Program Generation Using Executing Trace Based Constraint Extraction for Embedded Processors", IEEE Transactions on Very Large Scale Integration Systems, 2012. |
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