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tobdu_prits06

High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO

Tobias Dubois
 
Mohamed Azimane
Erik Larsson
 
Erik-Jan Marinissen
Paul Wielage
 
Clemens Wouters

14th Philips Research IC Test Seminar (PRITS), Eindhoven, The Netherlands, June 27, 2006

ABSTRACT


[DALM06] Tobias Dubois, Mohamed Azimane, Erik Larsson, Erik-Jan Marinissen, Paul Wielage, Clemens Wouters, "High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO", 14th Philips Research IC Test Seminar (PRITS), Eindhoven, The Netherlands, June 27, 2006
( ! ) perl script by Giovanni Squillero with modifications from Gert Jervan   (v3.1, p5.2, September-2002-)