Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), Cambridge, MA, USA, November 3-5, 2003, pp. 385-392
ABSTRACT
Test scheduling and Test Access Mechanism (TAM)design are two important tasks in the development of a System-on-Chip (SOC)test solution.Previous test scheduling techniques assume a dedicated designed TAM which have the advantage of high exibility in the scheduling process. However,hardware verhead for implementing the TAM and additional routing is required of the TAMs.In this paper we propose a technique that makes use of the existing functional buses for the test data transportation inside the SOC.We have dealt with the test scheduling problem with this new assumption and developed a technique to minimise the test-controller and buffer size for a bus- based multi-core SOC.We have solved the problem by using a constraint logic pr gramming (CLP) technique and demonstrated the ef ciency of our approach by running experiments on benchmark designs.
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[LLEP03] Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng, "Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip", 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), Cambridge, MA, USA, November 3-5, 2003, pp. 385-392 |
