A Uniform Test Generation Technique for Hardware/Software Systems
IEEE European Test Workshop, Constance, Germany, May 25-28, 1999
ABSTRACT
A novel hierarchical test generation technique for embedded systems containing hardware and software is proposed. Different from the traditional approaches, hardware and software parts of an embedded system are handled in a uniform way. We will in particular show how the proposed technique can be applied at the high levels of abstraction and how the software domain of the specification can also be successfully covered with experimental results.
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[JEP99] Gert Jervan, Petru Eles, Zebo Peng, "A Uniform Test Generation Technique for Hardware/Software Systems", IEEE European Test Workshop, Constance, Germany, May 25-28, 1999 |
