Incremental Testability Analysis for Partial Scan Selection and Design Transformations
IEEE European Test Workshop , Barcelona, Spain, May 27-29, 1998.
ABSTRACT
[YP98] Tianruo Yang, Zebo Peng, "Incremental Testability Analysis for Partial Scan Selection and Design Transformations", IEEE European Test Workshop , Barcelona, Spain, May 27-29, 1998. |
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