- Thermal-Aware SoC Test Scheduling
Zhiyuan He, Zebo Peng, Petru Eles
Book Chapter in "Design and Test Technology for Dependable Systems-on-chip", Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, ISBN: 978-1-6096-0212-3, 2010.
- Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation
Nima Aghaee, Zhiyuan He, Zebo Peng, Petru Eles
19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.
- Temperature Aware and Defect-Probability Driven Test Scheduling for System-on-Chip
Zhiyuan He
PhD Thesis No. 1321, Dept. of Computer and Information Science, Linköping University, June 2010 (Opponent: Professor Matteo Sonza Reorda, Politecnico di Torino, Italy).
- Multi-Temperature Testing for Core-based System-on-Chip
Zhiyuan He, Zebo Peng, Petru Eles
Design Automation and Test in Europe (DATE'2010), Dresden, Germany, March 8-12, 2010, pp. 208-213.
- Thermal-Aware Test Scheduling for Core-based SoC in an Abort-on-First-Fail Test Environment
Zhiyuan He, Zebo Peng, Petru Eles
12th EUROMICRO Conference on Digital System Design (DSD), Patras, Greece, August 27-29, 2009, pp. 239-246.
- Simulation-Driven Thermal-Safe Test Time Minimization for System-on-Chip
Zhiyuan He, Zebo Peng, Petru Eles
17th Asian Test Symposium (ATS), Sapporo, JAPAN, November 24-27, 2008, pp. 283-288.
- Challenges and solutions for thermal-aware SOC testing
Zebo Peng, Zhiyuan He, Petru Eles
Informacije midem (ISSN 0352-9045), 37 (4), 2007, pp. 220-227.
- System-on-Chip Test Scheduling with Defect-Probability and Temperature Considerations
Zhiyuan He
Licentiate Thesis No. 1313, Dept. of Computer and Information Science, Linköping University, June 2007
- Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
Zhiyuan He, Zebo Peng, Petru Eles, Paul Rosinger, Bashir M. Al-Hashimi
Journal of Electronic Testing; Theory and Applications (JETTA), Special Issue on DFT 2006, Vol. 24, Numbers 1-3, June 2008, pp. 247-257.
- A Heuristic for Thermal-Safe SoC Test Scheduling
Zhiyuan He, Zebo Peng, Petru Eles
International Test Conference (ITC), Santa Clara, USA, October 21-26, 2007, Lecture 5.2 (pp. 1-10)
- Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
Zhiyuan He, Zebo Peng, Petru Eles, Paul Rosinger, Bashir M. Al-Hashimi
International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'06), Arlington, Virginia, USA, October 4-6, 2006, pp. 477-485
- Power Constrained and Defect-Probability Driven SoC Test Scheduling with Test Set Partitioning
Zhiyuan He, Zebo Peng, Petru Eles
Swedish System-on-Chip Conference (SSoCC'06), Kolmården, Sweden, May 4-5, 2006 (Informal Digest)
- Power Constrained and Defect-Probability Driven SoC Test Scheduling with Test Set Partitioning
Zhiyuan He, Zebo Peng, Petru Eles
Design Automation and Test in Europe Conference (DATE 2006), Munich, Germany, March 6-10, 2006, pp. 291-296
- Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment
Zhiyuan He, Gert Jervan, Petru Eles, Zebo Peng
8th Euromicro Conference on Digital System Design (DSD'2005), Porto, Portugal, August 30 - September 3, 2005, pp. 83-86
- Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment
Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles
Swedish System-on-Chip Conference (SSoCC'05), Tammsvik, Stockholm, Sweden, April 18-19, 2005 (Informal Digest)
- Hybrid BIST Test Scheduling Based on Defect Probabilities
Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles
2004 IEEE Asian Test Symposium (ATS 2004), Kenting, Taiwan, November 15-17, 2004, pp. 230-235
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