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AUTHOR
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Y. DING
Found 1 entry
BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature
Y. Zhang, Y. Ding, Z. Peng, H. Li, M. Fujita, and J. Jiang
IEEE Trans. on Very Large Scale Integration (VLSI) Systems
( ! )
perl script by
Giovanni Squillero
with modifications from
Gert Jervan
(v3.1, p5.2, September-2002-)