- Test Data Truncation for Test Quality Maximisation under ATE Memory Depth Constraint
Erik Larsson, Stina Edbom
Journal on Computers & Digital Techniques, IET, Vol.1, Iss.1, January 2007, pp. 27-37.
- Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
Erik Larsson, Stina Edbom
Book Chapter in "Vlsi-Soc: From Systems To Silicon" (Editors: Ricardo Reis, Adam Osseiran, Hans-Joerg Pfleiderer), IFIP International Federation for Information Processing 240/2007, ISBN: 978-0-387-73660-0, Springer, 2007.
- Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
Erik Larsson, Stina Edbom
IFIP WG 10.5 Conference on Very Large Scale Integration System-on-Chip (IFIP VLSI-SOC) 2005, Perth, Australia, October 17-19, 2005, pp. 429-434
- An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint
Stina Edbom, Erik Larsson
2004 IEEE Asian Test Symposium (ATS 2004), Kenting, Taiwan, November 15-17, 2004, pp. 254-257
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