- Cost Reduction of Wear-Out Monitoring by Measurement Point Selection
Urban Ingelsson, Shih-Yen Chang, Erik Larsson
The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
- Measurement Point Selection for In-Operation Wear-Out Monitoring
Urban Ingelsson, Shih-Yen Chang, Erik Larsson
14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS11), Cottbus, Germany, April 13-15, 2011.
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