- Thermal Issues in Testing of Advanced Systems on Chip
Nima Aghaee Ghaleshahi
PhD Thesis No. 1702, Dept. of Computer and Information Science, Linköping University, December 2015 (Opponent: Professor Jaan Raik, Tallinn University of Technology, Tallinn, Estonia).
- A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs
Nima Aghaee, Zebo Peng, Petru Eles
Journal of Electronic Testing: Theory and Applications 2015
- Efficient Test Application for Rapid Multi-Temperature Testing
Nima Aghaee, Zebo Peng, Petru Eles
25th Great Lakes Symposium on VLSI (GLSVLSI15), Pittsburgh, PA, USA, May 20-22, 2015.
- An Integrated Temperature-Cycling Acceleration and Test Technique for 3D Stacked ICs
Nima Aghaee, Zebo Peng, Petru Eles
20th Asia and South Pacific Design Automation Conference (ASP-DAC 2015), Chiba/Tokyo, Japan, Jan. 19-22, 2015.
- Temperature-Gradient Based Burn-In and Test Scheduling for 3D Stacked ICs
Nima Aghaee, Zebo Peng, Petru Eles
IEEE Transactions on Very Large Scale Integration Systems (VLSI 2015).
- Temperature-Gradient Based Test Scheduling for 3D Stacked ICs
Nima Aghaee, Zebo Peng, Petru Eles
20th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2013), Abu Dhabi, United Arab Emirates, December 9-12, 2013.
- Process-Variation Aware Multi-Temperature Test Scheduling
Nima Aghaee, Zebo Peng, Petru Eles
27th International Conference on VLSI Design (VLSID 2014), IIT Bombay, Mumbai, India, January 5-9, 2014.
- An Efficient Temperature-Gradient Based Burn-In Technique for 3D Stacked ICs
Nima Aghaee, Zebo Peng, Petru Eles
Design, Automation & Test in Europe (DATE 2014), Dresden, Germany, March 24-28, 2014.
- Temperature-Gradient Based Burn-In for 3D Stacked ICs
Nima Aghaee, Zebo Peng, Petru Eles
The 12th Swedish System-on-Chip Conference (SSoCC 2013), Ystad, Sweden, May 6-7, 2013 (not reviewed, not printed).
- Process-variation and Temperature Aware SoC Test Scheduling Technique
Nima Aghaee, Zebo Peng, Petru Eles
Journal of Electronic Testing: Theory and Applications, Aug. 2013, Volume 29, Issue 4, pp. 499-520.
- Process-Variation and Temperature Aware SoC Test Scheduling Using Particle Swarm Optimization
Nima Aghaee, Zebo Peng, Petru Eles
The 6th IEEE International Design and Test Workshop (IDT 2011), Beirut, Lebanon, December 11–14, 2011.
- Adaptive Temperature-Aware SoC Test Scheduling Considering Process Variation
Nima Aghaee, Zebo Peng, Petru Eles
14th Euromicro Conference on Digital System Design (DSD11), Oulu, Finland, August 31 – September 2, 2011.
- Heuristics for Adaptive Temperature-Aware SoC Test Scheduling Considering Process Variation
Nima Aghaee, Zebo Peng, Petru Eles
The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
- Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation
Nima Aghaee, Zhiyuan He, Zebo Peng, Petru Eles
19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.
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