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Found 2 entries
  1. BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature
    Y. Zhang, Y. Ding, Z. Peng, H. Li, M. Fujita, and J. Jiang
    IEEE Trans. on Very Large Scale Integration (VLSI) Systems
  2. Temperature-Aware Software-Based Self-Testing for Delay Faults
    Ying Zhang, Zebo Peng, J. Jiang, H. Li, M. Fujita
    Proc. Design, Automation and Test in Europe Conference (DATE’15), Grenoble, France, Mar. 9-13, 2015.
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