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nimag_TVLSI15

Temperature-Gradient Based Burn-In and Test Scheduling for 3D Stacked ICs

Nima Aghaee
 
Zebo Peng Author homepage
Petru Eles Author homepage

IEEE Transactions on Very Large Scale Integration Systems (VLSI 2015).

ABSTRACT


[APE15] Nima Aghaee, Zebo Peng, Petru Eles, "Temperature-Gradient Based Burn-In and Test Scheduling for 3D Stacked ICs", IEEE Transactions on Very Large Scale Integration Systems (VLSI 2015).
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