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Found 3 entries
  1. Temperature-Aware Software-Based Self-Testing for Delay Faults
    Ying Zhang, Zebo Peng, J. Jiang, H. Li, M. Fujita
    Proc. Design, Automation and Test in Europe Conference (DATE’15), Grenoble, France, Mar. 9-13, 2015.
  2. Automatic Test Program Generation for Out-of-Order Superscalar Processors
    Ying Zhang, Ahmed Rezine, Petru Eles, Zebo Peng
    21st IEEE Asian Test Symposium (ATS 2012), Niigata, Japan, November 19-22, 2012.
  3. Automatic Test Program Generation Using Executing Trace Based Constraint Extraction for Embedded Processors
    Ying Zhang, Huawei Li, Xiaowei Li
    IEEE Transactions on Very Large Scale Integration Systems, 2012.
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