- Multiple Constraints Driven System-on-Chip Test Time Optimization
Erik Larsson, Julien Pouget, Zebo Peng
Journal of Electronic Testing; Theory and Applications (JETTA), Volume 21, Number 6, December 2005, pp. 599-611
- Abort-on-Fail Based Test Scheduling
Erik Larsson, Julien Pouget, Zebo Peng
Journal of Electronic Testing; Theory and Applications (JETTA), Volume 21, Number 6, December 2005, pp. 651-658
- Defect-Aware SOC Test Scheduling
Erik Larsson, Julien Pouget, Zebo Peng
2004 IEEE VLSI Test Symposium (VTS'04), Napa Valley, USA, April 2004, pp. 359-364
- SOC Test Time Minimization Under Multiple Constraints
Julien Pouget, Erik Larsson, Zebo Peng
12th IEEE Asian Test Symposium (ATS03), Xian, China, November 17-19, 2003, pp. 312-317
- An Efficient Approach to SoC Wrapper Design, TAM Configuration and Test Scheduling
Julien Pouget, Erik Larsson, Zebo Peng, Marie-Lise Flottes, Bruno Rouzeyre
IEEE European Test Workshop 2003 (ETW'03), Maastricht, The Netherlands, May 25-28, 2003, pp 51-56 (Formal Proceedings)
- An Efficient Approach to SoC Wrapper Design, TAM Configuration and Test Scheduling
Julien Pouget, Erik Larsson, Zebo Peng, Marie-Lise Flottes, Bruno Rouzeyre
IEEE European Test Workshop 2003 (ETW'03), Maastricht, The Netherlands, May 25-28, 2003, pp. 117-122 (Informal Proceedings)
- Defect Probability-based System-On-Chip Test Scheduling
Erik Larsson, Julien Pouget, Zebo Peng
6th IEEE International Workshop on Design and Diagnostics of Electronics Circuits and Systems (DDECS'03), Poznan, Poland, April 14-16, 2003, pp. 25-32
- System-on-Chip Test Scheduling based on Defect Probability
Erik Larsson, Julien Pouget, Zebo Peng
2003 International Test Synthesis Workshop (ITSW), Santa Barbara, CA, USA, March 31 - April 2, 2003
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