- Software-based Self-Testing using Bounded Model Checking for Out-of-Order Superscalar Processors
Ying Zhang, Krishnendu Chakrabarty, Zebo Peng, Ahmed Rezine, Huawei Li, Petru Eles, Jianhui Jiang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- A Deterministic-Path Routing Algorithm for Tolerating Many Faults on Wafer-Level NoC
Zhongsheng Chen, Ying Zhang, Zebo Peng, Jianhui Jiang
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), Florence, Italy
- Software-based Self-Testing using Bounded Model Checking for Out-of-Order Superscalar Processors
Ying Zhang, Krishnendu Chakrabarty, Zebo Peng, Ahmed Rezine, Huawei Li, Petru Eles, Jianhui Jiang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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