Testing of Digital Systems
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Goals: 
To study the basic principles and practice of test technology and
design-for-test methods for digital systems. To address also issues
related to the integration of test consideration with system
synthesis and to system-on-chip testing.

Prerequisites:
Basic knowledge of computer organization and digital hardware.

Recommended for:
IDA Ph.D. students in computer science and computer systems.
ECSEL students.

Organization:
Mainly lectures given by the teachers, which will be supplemented
by seminars prepared by the participants.

Contents:
- Introduction.
- Fault modeling and simulation.
- Automatic test pattern generation.
- Basic principles of design for testability.
- Testability analysis.
- Testability enhancement techniques.
- Test synthesis.
- Testability issues in hardware/software systems.
- Test issues related to system-on-chip.
- On-line testing and self-checking design.
- Built-in self-test and special BIST architectures.

Main literature:
- M. Abramovici, M. A. Breuer, and A. D. Friedman, "Digital Systems
  Testing and Testable Design," Computer Science Press, 1990,
  ISBN 0-7803-1062-4
- Lecture notes
- Selected papers

Teachers: 
Zebo Peng and Petru Eles

Credits:
4 points

Schedule:
Oct-Dec 2000

Examination:
Term paper and seminar presentation.