************************************************************************** Title: Embedded deterministic test of digital integrated circuits Abstract: Manufacture test is a key step in the implementation flow of digital integrated circuits. This is because it enables the fabrication yield, certifies the product quality and influences the final cost of the device. Embedded deterministic test is a manufacture test paradigm that combines the compression advantage of built-in self-test with the high fault coverage of deterministic stimuli, inherent to methods based on automatic test pattern generation and external testers. This talk overviews the key factors that lead to the adoption of embedded deterministic test, outlines the recent innovations in the field and predicts the problems lying ahead. *************************************************************************