Test Scheduling for Modular SOCs in an Abort-on-Fail Environment

Urban Ingelsson²

Sandeep Kumar Goel¹

Erik Larsson²

Erik Jan Marinissen¹

¹ Philips Research Labs IC Design - Digital Design & Test Prof. Holstlaan 4 - WAY-41 5656 AA Eindhoven, The Netherlands sandeepkumar.goel@philips.com, erik.jan.marinissen@philips.com	² Linköpings Universitet Department of Computer Science Embedded Systems Laboratory Linköping, Sweden urbin545@student.liu.se, erila@ida.liu.se

This web page presents the article "Test Scheduling for Modular SOCs in an Abort-on-Fail Environment" that was published at the European Test Symposium (ETS) in May 2005 in Tallinn, Estonia. There is the article itself along with the presenation slides and some additional experimental results.

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The article (html)

The article (pdf)

The presenation slides (pdf)

Module test pass probability sets used in the experiments

Additional experimental results