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TDDC33 Design for Test of Digital Systems (6.0 ECTS)

2012

  • Lecture 1 Introduction, Manufacturing, Defects, and Faults <[PDF]>
  • Lectures 2 Test generation <[PDF]>
  • Lecture 3 Design-for-Test techniques <[PDF]>
  • Lecture 4 Test Data Compression and Built-In Self-Test<[PDF]>
  • Lectures 5 System-on-Chip Testing <[PDF]>
  • Lectures 6 Boundary Scan and System Test <[PDF]>
  • Lecture 7 Invited Talk by Dr. Ingemar Söderquist, SAAB
  • Lecture 8 Invited Talk by Dr. Thomas Granlund, SAAB
  • Some abreviations <[PDF]>
    • Animation of scan-chain

    Page responsible: Erik Larsson
    Last updated: 2012-09-21