TDDC33 Design for Test of Digital Systems

Course information

Organization

The course consists of 8 lectures (Fö), together with one lesson (Le) and 4 two-hour lab sessions (La).

The course gives, in total, 6 points (6 ECTS). You will get 3 points for the examination, and 3 points for the labs.

The course language is English.

Literature

The recommended textbook is:

• VLSI Test Principles and Architectures, Laung-Terng Wang, Chen-Wen Wu, Xiaoqing Wen Hardbound, 808 pages, publication date: JUL-2006, ISBN-13: 978-0-12-370597-6 ISBN-10: 0-12-370597-5, Imprint: MORGAN KAUFFMAN

Survey/tutorial papers:

Survey papers

Alternative literature:

• Principles of Testing Electronic Systems, Samiha Mourad and Yervant Zorian, ISBN: 978-0-471-31931-3, Hardcover, 440 pages, August 2000
• Digital Systems Testing and Testable Design, Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman ISBN: 978-0-7803-1062-9, Hardcover, 672 pages, September 1994, Wiley-IEEE Press
• Essential of Electronic Testing for Memory and Mixed-Signal VLSI Circuits, Michael L. Bushnell and Vishwani D. Agrawall, 1st ed. 2000. Corr. 2nd printing, 2005, 712 p., Hardcover ISBN: 978-0-7923-7991-1
• Introduction to Advanced System-on-Chip Test Design and Optimization, Erik Larsson, Series: Frontiers in Electronic Testing , Vol. 29, 2005, XVI, 388 p., Hardcover, ISBN: 978-1-4020-3207-3

Examination

Written Exam.

The written examination will be held on the 24th of October 2012, 08:00 - 12:00 (see details).

Course Staff

Page responsible: Erik Larsson
Last updated: 2012-08-23