Search Results

Author:TOBIAS DUBOIS
Found 2 entries
  1. Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
    Tobias Dubois, Erik-Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters
    Design, Automation, and Test in Europe (DATE), Nice, France, April 16-20, 2007, pp. 859-864.
  2. High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
    Tobias Dubois, Mohamed Azimane, Erik Larsson, Erik-Jan Marinissen, Paul Wielage, Clemens Wouters
    14th Philips Research IC Test Seminar (PRITS), Eindhoven, The Netherlands, June 27, 2006
( ! ) perl script by Giovanni Squillero with modifications from Gert Jervan   (v3.1, p5.2, September-2002-)
Last modified on Monday December 04, 2006 by Gert Jervan