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Author:STINA EDBOM
Found 4 entries
  1. Test Data Truncation for Test Quality Maximisation under ATE Memory Depth Constraint
    Erik Larsson, Stina Edbom
    Journal on Computers & Digital Techniques, IET, Vol.1, Iss.1, January 2007, pp. 27-37.
  2. Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
    Erik Larsson, Stina Edbom
    Book Chapter in "Vlsi-Soc: From Systems To Silicon" (Editors: Ricardo Reis, Adam Osseiran, Hans-Joerg Pfleiderer), IFIP International Federation for Information Processing 240/2007, ISBN: 978-0-387-73660-0, Springer, 2007.
  3. Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
    Erik Larsson, Stina Edbom
    IFIP WG 10.5 Conference on Very Large Scale Integration System-on-Chip (IFIP VLSI-SOC) 2005, Perth, Australia, October 17-19, 2005, pp. 429-434
  4. An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint
    Stina Edbom, Erik Larsson
    2004 IEEE Asian Test Symposium (ATS 2004), Kenting, Taiwan, November 15-17, 2004, pp. 254-257
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