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Author:ADOLFSSON
Found 3 entries
  1. On Scan Chain Diagnosis for Intermittent Faults
    Dan Adolfsson, Joanna Siew, Erik Jan Marinissen, Erik Larsson
    IEEE Asian Test Symposium (ATS), Taichung, Taiwan, November 23-26, 2009, pp. 47-54.
  2. Deterministic Scan-Chain Diagnosis for Intermittent Faults
    Dan Adolfsson, Joanna Siew, Erik Larsson, Erik Jan Marinissen
    European Test Symposium (ETS 2009), Sevilla, Spain, May 25-29, 2009 (Poster).
  3. Improved Scan Chain Diagnosis
    Erik-Jan Marinissen, Dan Adolfsson, Erik Larsson, Sandeep-Kumar Goel
    15th NXP IC Test Symposium (NITS'07), Eindhoven, The Netherlands, June 11, 2007 (Informal Digest)
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